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NEWS
The
Cutting Edge of Technology
The 9R Razor is now available in our 50mil, .250" travel series probes.
This 9R Razor is designed to contact solder domes and test pads on 50mil centers.
PDF
New Tip style for Bead Probe Technology.
Our new micro-serrated tip styles offer an added solution in extreme
conditions where contaminants, fluxes or oxides make it difficult to achieve reliable contact.
PDF
New Long-Stroke Teradyne Interface Probes
This new probe can be used as replacements in Teradyne’s
TestStation LH and LX test systems. PDF
Our new integraMate ICS 40 Series high reliable hyperboloid contacts
are
designed to mate with Ø.40mm
pins & used on .050" centers.
PDF
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| IDO2
Series
Circular
Connectors |
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| Specifications |
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| 3.5 lbs. max. |
EIA-364, TP 13 |
| 20.0 lbs. min. |
EIA-364, TP 90 |
| 5.0 lbs. min. per contact |
EIA-364, TP 29 |
| 10,000 min. |
EIA-364, TP 9 |
| 19.64 G (root mean square) |
EIA-364, TP 28; Test Condition V;
Mil-Std-1344, Method 2005 |
| 50 G |
EIA-364, TP 27; Mil-Std-1344,
Method 2004 |
| See contact pattern |
EIA-364, TP 70 |
| See contact pattern |
EIA-364, TP 23; Mil-Std-1344,
Method 3002 |
| >10,000 MΩ |
EIA-364, TP 21; Mil-Std-1344,
Method 3003 |
| See contact pattern |
EIA-364, TP 20; Mil-Std-1344,
Method 3001 |
| IP50 |
IEC 60529 |
| -40°C to 85°C |
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| Polycarbonate (PC) |
| Polyethersulfone (PES) |
| Thermoplastic Elastomer (TPE) |
| Die Cast Zinc with Nickel Plating |
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| Beryllium Copper |
| High Conductivity Copper Alloys |
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50 μ-inch of gold plating over nickel on all sliding contact surfaces |
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10 μ-inch of gold plating on all other surfaces
(note the ends of contact wires and mounting clips are not plated) |
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