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QA's
patented rolled design probes
attribute their increased accuracy
and performance to our fully
automatic assembly and test
machines. Our machines are
designed and built in-house,
from the micro-processor controllers
to the assembly mechanisms
themselves.
The
machines that assemble our
075-25, 075-40, 100-25, 100-40
and X Probe Socketless Series
probes automatically test the
probes for spring force, sliding
friction, plunger stroke and
lubrication. Our 025-16, 039-16,
050-R25, 050-T25 and 125-25
series also share a unique
patented design offering several
major advantages:
The
first is a probe tube and plunger
design that reduces radial
plunger play at the probe tube
opening. The clearance between
the tube and the plunger has
been reduced by forming the
tube around the plunger itself.
This feature reduces play from
side to side and significantly
improves pointing accuracy.
These
probes also feature a patented
biasing system for the tail
end of the plunger. Biasing
is the name given to the intentional
loading of the plunger against
the inside surface of the probe
tube. An angled surface machined
on the plunger tail mates with
the spring and allows it to
exert a small radial force
on the tube. This biasing force
causes a well-defined wiping
action between the plunger
and the inner surface of the
probe tube to provide improved
electrical contact.
Another
unique design and performance
advantage of this probe design
is the increased spring space
in the tube. Through this design,
our probes offer higher spring
forces than any competitive
probe of the same overall size.
In addition, the 100-25 series
is the industry's only .100" [2.54
mm] center spacing .250" [6.35
mm] stroke probe that can be
used at full stroke without
the risk of spring fatigue
failure.
The
test probe acts as an electrical
interface between the test
equipment and the circuit board
under test. In our continual
effort to improve this critical
interface, we are constantly
at work designing and testing
new components that operate
with better performance. |
