NEWS

New Tip style for Bead Probe Technology.
Our new micro-serrated tip styles offer an added solution in extreme conditions where contaminants, fluxes or oxides make it difficult to achieve reliable contact. PDF

New Long-Stroke Teradyne Interface Probes
This new probe can be used as replacements in Teradyne’s TestStation LH and LX test systems. PDF

Our new integraMate ICS 40 Series high reliable hyperboloid contacts are designed to mate with Ø.40mm pins & used on .050" centers. PDF

	Product Design   QA's patented rolled design probes attribute their increased accuracy and performance to our fully automatic assembly and test machines. Our machines are designed and built in-house, from the micro-processor controllers to the assembly mechanisms themselves. The machines that assemble our 075-25, 075-40, 100-25, 100-40 and X Probe Socketless Series probes automatically test the probes for spring force, sliding friction, plunger stroke and lubrication. Our 025-16, 039-16, 050-R25, 050-T25 and 125-25 series also share a unique patented design offering several major advantages: The first is a probe tube and plunger design that reduces radial plunger play at the probe tube opening. The clearance between the tube and the plunger has been reduced by forming the tube around the plunger itself. This feature reduces play from side to side and significantly improves pointing accuracy. These probes also feature a patented biasing system for the tail end of the plunger. Biasing is the name given to the intentional loading of the plunger against the inside surface of the probe tube. An angled surface machined on the plunger tail mates with the spring and allows it to exert a small radial force on the tube. This biasing force causes a well-defined wiping action between the plunger and the inner surface of the probe tube to provide improved electrical contact. Another unique design and performance advantage of this probe design is the increased spring space in the tube. Through this design, our probes offer higher spring forces than any competitive probe of the same overall size. In addition, the 100-25 series is the industry's only .100" [2.54 mm] center spacing .250" [6.35 mm] stroke probe that can be used at full stroke without the risk of spring fatigue failure. The test probe acts as an electrical interface between the test equipment and the circuit board under test. In our continual effort to improve this critical interface, we are constantly at work designing and testing new components that operate with better performance.