QA Technology is globally recognized for exceptional product performance, competitive prices, fast delivery and outstanding service.

Our spring loaded test probes and hyperboloid contacts are trusted and specified by the world’s most recognized technology companies and PCB test fixture manufacturers. Our customers know they will produce a higher quality product, meet delivery demands, and achieve higher production yields.

QA technology 2018 Probe Guide includes detailed specifications for spring loaded probes, probe tips and tools


Visit the following pages to see detailed specifications, configure products & order online.

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What's New

Self-Cleaning 55 Crown Tip Style

June 2019

Our “55” self-cleaning steel crown tip style is now available in our .400 [10.16] long stroke 100-mil and X75 Socketless probe series to capture smaller leads and posts in dual level testing. This crown has 5 high and 5 low ridges to trap and prevent the lead or post from glancing off the head. The short inner ridges make them stronger and less susceptible to damage; while its self-cleaning design reduces contaminant buildup, making them easier to clean.

High preload spring force in any of our headless steel tip styles.

May 2019

QA’s high preload springs offer a higher force during the first 2/3rd of actuation, resulting in better probe tip penetration and higher first-pass yields. You can not only get the spring force you need, but with a tip that is more suitable for the intended target.

Probe Identification

April 2019

New laser markings will now be featured on our 50-mil and X39 probe series. Complete probe specifications can easily be identified for exact replacement during regularly scheduled maintenance.

Self-Cleaning G4 Crown Tip Style

February 2019

Our new “G4” Crown tip style is a self-cleaning steel tip designed with 4 sharp cutting edges to contact solder domes, test pads and capturing small short leads. The Ø.020 [0.51] diameter across the 100, 75 and 50mil probe series gives the advantage of the same tip geometry for a given contact feature on the Unit Under Test (UUT).