Designed for wireless testing.
Double-ended termination pins allow construction of X Probe Socketless fixtures with far shorter signal path lengths than conventional wire wrap designs. The shorter path length allows better control of the signal from the tester circuits to the Unit Under Test (UUT). Note: Top test probe is not included with the double-ended termination and should be ordered separately.
Compatible probe series: X31-16, X31-25 and X31-40
| Plates | Hole Size | Drill Size |
| Probe Plate | 0.0250/0.0260 [0.635/0.660] | #71 or .65mm |
| Back Plate | 0.0217/0.0225 [0.551/0.572] | #74 or .57mm |
| Material | Max Set Height | Full Stroke | Order your P/N |
| Tube: Nickel Silver/ID Precious Metal Clad. Term & Tip: Heat tred BeCu/gold plated over nickel |
0.000 [0.00] | 0.100 [2.54] | |
| Tube: Nickel Silver/ID Precious Metal Clad. Term & Tip: Heat tred BeCu/gold plated over nickel |
0.020 [0.51] | 0.150 [3.81] |
| Part Number |
Preload | @Working Stroke | Material | Cycle Life @ Stroke |
| X31-TDS3-00 | 1.0 [28g/0.28N] | 3.8 [108g/1.04N] | SS | 10,000 @ 0.075 [1.91] |
| X31-TDS3-02 | 1.0 [28g/0.28N] | 3.8 [108g/1.04N] | SS | 10,000 @ 0.100 [2.54] |
All specifications subject to change without notice. All dimensions are in [mm]. All spring forces are oz [gm/newtons]. US Patent No. 6,570,399 & 4,885,533.